hyperfine超高分辨率光谱仪-j9官网

• specifications

part number	spectral region	form   factor	total range	simultaneous range	resolution*	resolution
			with grating rotation	at a fixed grating position	pm	1/cm
hf-8888-uv	uv	c	200 - 400nm	fixed 60nm range	<30pm	0.9/cm
hf-8888-uvlibs	uv (gated)	c	200 - 400nm	fixed 60nm range	<30pm	0.9/cm
hf-9332	vis	c	450 - 700nm	fixed 250nm range	<25pm	0.9/cm
hf-9353	nir	c	750 -1050nm	fixed 300nm range	<40pm	0.5/cm
hf-8989-1	vis	a	425 - 500 nm	17 nm	1.7 pm	0.08/cm
hf-8989-2	vis	a	500 - 600 nm	16 nm	1.6 pm	0.05/cm
hf-8989-2e	vis	a	525 - 640 nm	16 nm	1.6 pm	0.05/cm
hf-8989-3	vis	a	600 - 700 nm	16 nm	1.6 pm	0.04/cm
hf-8995-1	nir	a	700 - 800 nm	20 nm	2.0 pm	0.03/cm
hf-8991-3	nir	a	800-950 nm	25 nm	2.0 pm	0.02/cm
hf-8995-2	nir	a	950 - 1100 nm	25 nm	2.5 pm	0.02/cm
hf-8995-3-plasma	nir	d	775-900nm	9 nm	0.9 pm	0.01/cm
hf-8999-pk-lll-**	vis	d			1.0 pm	0.04/cm
*-uhr	2x resolution upgrade to any model.

• notes

u  form factors (enclosure dimensions, does not include camera or input port)

ø a  dimensions; 250 x 600 x 150mm,  weight; 20kg

ø b  dimensions; 200 x 200 x 90mm,  weight; 2kg

ø c  dimensions; 160 x 200 x 100mm,  weight; 1.5kg

ø d  dimensions; 700 x 150 x 400mm,  weight; 28kg

ø e dimensions; 700 x 150 x 250mm, weight 28kg

ø f dimensions; 400 x 500 x 150mm, weight 24kg

u  *range and resolution are measured at the middle of the wavelength range

u  accuracy: < 200pm for fixed grating units, <20pm for all others following calibration, an external calibration source is required

u  dynamic range: 100:1 to 500:1 in a single shot measurement, up to 50db with exposure bracketing

u  simultaneous range / resolution: >10,000 at 532nm

u  acquisition speed: >10hz typical

u  ** is specifically designed for brillouin scattering and includes a multi-pass etalon for 532nm elastic scattering suppression.

• options

u  mmf input with a 10um slit, smf input with no slit is standard

ulow resolution mode, covers the total range with 0.2nm resolution

u  camera options; 

ø cmos for laser characterization, passive element characterization, brillouin, raman and solar spectroscopy

ø ccd for low light applications (non -scanning of brillouin biological samples)

ø scientific cmos for low light applications requiring fast acquisition

ø iccd for applications requiring gating (libs)

ø uv c-mos with good quantum efficiency down to 260nm

 

• features

u  fast, no moving parts (single shot laser spectrum analysis)

u  sub picometer resolution

u  fiber optic input

u  quick data acquisition and export

u  simple usb interface

u  labview drivers

• benefits

u  fast

u  compact

u  can resolve hyper fine spectra below 1 picometer

u  ultra-reliable

u  lightmachinery's legendary customer support

 

• application

light sources characterization

u  lasers of all types

u  single shot pulsed laser spectrum 

u  super luminescent diodes

u  gas discharge lamps, etc

spectroscopy

u  plasma spectroscopy

u high-precision gas spectroscopy

u  brillouin or raman spectroscopy

u  femtosecond comb fingerprinting spectroscopy

uspectral-domain optical coherence tomography, etc

u  solar spectroscopy

u  astronomical spectroscopy

u  ultra low frequency raman

u  undergraduate physics and chemistry laboratories

ø zeeman splitting

ø hyperfine magnetic structure of elements

ø hydrogen structure

ø doppler shift of fraunhofer lines due to sun rotation

passive components characterization

u notch filters

u  etalons

u  fiber bragg gratings, etc

• how does it work?

light enters the hyperfine spectrometer though a fiber.   a vipa etalon, manufactured using lightmachinery's proprietary fluid jet polishing technology,  is used to produce very high dispersion in the vertical axis with sub picometer resolution.  this is followed by a conventional grating to disperse overlapping orders in the horizontal direction and produce a 2d spectrum of the input light.  lightmachinery software unwraps the spectrum to produce an ultra high resolution wavelength spectrum of the input light.  a secondary camera provides a wide wavelength range, lower resolution view of the spectrum.